Advanced Materials 2 Multimode AFM

Veeco Multimode V
Location	Chemistry, University of Warwick (C102)
Custodian	Professor Julie Macpherson
Applications	Atomic force microscope capable of imaging in air and fluid, as well as making electrical measurements. Large scope of samples may be studied such as nanoparticles, electrode surfaces, thin films and biological samples.
Specification	Sub-angstrom resolution Maximum scan size 150 x 150 microns Z range 5 microns Maximum resolution 5120 x 5120 pixels Full range of standard force modes Fast data capture Dedicated conducting AFM module

JPK Instruments Nanowizard II
Location	Chemical Engineering, University of Birmingham (102)
Custodian	Professor Mike Adams
Applications	Atomic force microscope capable of imaging in air and fluid, as well as making electrical measurements. Large scope of samples may be studied such as nanoparticles, electrode surfaces, thin films and biological samples.
Specification	Large scan field of 100 × 100 × 15 µm³ Range (x, y, z): 100 μm, 100 μm, 100 μm Sub Ångstrom resolution Dedicated conducting module Cellhesion controller Biocell controller Petri-dish heater Electrochemical cell Biopotentiostat