Nanofilm EP3-SE
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Location
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Chemistry, University of Warwick (C103a)
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Custodian
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Professor Pat Unwin
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Applications
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Ellipsometry may be used for the determination of film thickness, morphology, microtribology, electric and optic properties of multilayer metal/metaloxides; self assembled molecules and thin film polymeric materials; next generation energy-efficient glazings. Surface Plasmon resonance package is available for molecular surface interaction investigations. |
| Specification |
- Spectroscopic ellipsometer with 46 wavelengths between 365 nm to 1000 nm
- Wavelength and angle of incidence scanning
- Mapping function
- Lateral resolution 1 µm
- Surface plasmon resonance (SPR) cell
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